Subscribe: Journal of Electron Microscopy - Advance Access
Preview: Journal of Electron Microscopy - Advance Access

Microscopy Advance Access

Published: Thu, 23 Nov 2017 00:00:00 GMT

Last Build Date: Thu, 23 Nov 2017 01:49:30 GMT


Gold nanoparticle printed coverslips to facilitate fluorescence-TEM correlative microscopy


Correlative light and electron microscopy (CLEM) allows combining the advantages of fluorescence microscopy and electron microscopy for cell imaging. Rare phenomenon expressing cells can be studied by specifically tagged fluorophores with fluorescence microscopy. Subsequently, cells can be fixed and ultra-structural details can be studied with transmission electron microscopy (TEM) at a higher resolution. However, precise landmarks are necessary to track the same cell throughout the CLEM process. In this technical report, we present a high contrast inkjet-printed gold nanoparticle patterns over commercial glass coverslip to facilitate cell tracking with correlative microscopy. High contrast and strong reflection from nano gold pattern can be used as a fixed landmark for cell identification with fluorescence microscopy. Nano gold printed letters over coverslips are visible in resin blocks, which can be further used to identify the cell of interest for performing sectioning of embedded cell blocks for TEM.

A quantum mechanical exploration of phonon energy-loss spectroscopy using electrons in the aloof beam geometry


Phonon energy-loss spectroscopy using electrons has both high resolution and low resolution components, associated with short- and long-range interactions, respectively. In this paper, we discuss how these two contributions arise from a fundamental quantum mechanical perspective. Starting from a correlated model for the atomic motion we show how short range ‘impact’ scattering and long range ‘dipole’ scattering arises. The latter dominates in aloof beam imaging, an imaging geometry in which radiation damage can be avoided.

Precise method for measuring spatial coherence in TEM beams using Airy diffraction patterns


We have developed a method to precisely measure spatial coherence in electron beams. The method does not require an electron biprism and can be implemented in existing analytical transmission electron microscopes equipped with a post-column energy filter. By fitting the Airy diffraction pattern of the selector aperture, various parameters such as geometric aberrations of the lens system and the point-spread function of the diffraction blurring are precisely determined. From the measurements of various beam diameters, components that are attributed to the partial spatial coherence are successfully separated from the point-spread functions. A linear relationship between the spatial coherence length and beam diameter is revealed, thus indicating that a wide range of coherence lengths can be determined by our proposed method as long as the coherence length remains >80% of the aperture diameter. A remarkable feature of this method is its ability to simultaneously determine diffraction blurring and lens aberrations. Possible applications of this method are also discussed.