Preview: Forthcoming in Journal of Synchrotron Radiation
Forthcoming article in Journal of Synchrotron Radiation
Synchrotron radiation research is rapidly expanding with many new sources of radiation being created globally. Synchrotron radiation plays a leading role in pure science and in emerging technologies. The Journal of Synchrotron Radiation provides comprehen
Surface EXAFS via differential electron yield
The surface-sensitive performance of extended X-ray absorption fine structure (EXAFS) spectroscopy via differential electron yield is demonstrated using a thickness-defined SiO2 (12.4 nm)/Si sample. The Si K-edge EXAFS spectrum suggests an analysis depth of approximately 4.2 nm, and the derived first nearest neighbor (Si—O) distance was 1.63 Å, which is within the reported values of SiO2.