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Forthcoming article in Journal of Synchrotron Radiation



Synchrotron radiation research is rapidly expanding with many new sources of radiation being created globally. Synchrotron radiation plays a leading role in pure science and in emerging technologies. The Journal of Synchrotron Radiation provides comprehen



 



Surface EXAFS via differential electron yield
The surface-sensitive performance of extended X-ray absorption fine structure (EXAFS) spectroscopy via differential electron yield is demonstrated using a thickness-defined SiO2 (12.4 nm)/Si sample. The Si K-edge EXAFS spectrum suggests an analysis depth of approximately 4.2 nm, and the derived first nearest neighbor (Si—O) distance was 1.63 Å, which is within the reported values of SiO2.



Study on the reflectivity properties of spherically bent analyser crystals. Corrigendum
Corrections to the paper by Honkanen et al. (2014). [J. Synchrotron Rad. 21, 104–110] are made.



Performance on absolute scattering intensity calibration and protein molecular weight determination at BL16B1, a dedicated SAXS beamline at SSRF
The bending-magnet beamline BL16B1, dedicated to small-angle X-ray scattering at the Shanghai Synchrotron Radiation Facility, is described. The detailed beamline performance on absolute scattering intensity calibration and protein molecular weight determination is demonstrated.