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Preview: Forthcoming article in Journal of Applied Crystallography

Forthcoming article in Journal of Applied Crystallography



Journal of Applied Crystallography covers a wide range of crystallographic topics from the viewpoints of both techniques and theory. The journal presents articles on the application of crystallographic techniques and on the related apparatus and computer



 



A quick convergent-beam laboratory X-ray reflectometer using a simultaneous multiple-angle dispersive geometry
An X-ray reflectometer using a laboratory X-ray source that can measure the specular X-ray reflectivity curve with a time resolution of 10 s or less was developed. Low reflectivities can be measured accurately because the background can be subtracted from the signal.



X-ray investigation of strained epitaxial layer systems by reflections in skew geometry
The ability and technical requirements for a complex characterization of strained epitaxial layer systems by using reflections in skew geometry is discussed on four examples of SiGe/Si(001) structures.






Rod-like particles growing in sol-gel processing of 1:1 molar mixtures of 3-glycidoxypropyl­tri­meth­oxy­silane and tetra­eth­oxy­silane
Rod-like particles with constant radius and variable length grow at the firstly stages of aggregation in the sol-gel processing of 1:1 molar mixtures of 3-glycidoxypropyl­tri­meth­oxy­silane and tetra­eth­oxy­silane. Larger aggregates with higher dimensionality formed by rod-like subunits grow at more advanced degrees of aggregation.






Scanning X-ray nanodiffraction from ferroelectric domains in strained K0.75Na0.25NbO3 epitaxial films grown on (110) TbScO3
Scanning X-ray nanodiffraction with 100 nm spatial resolution has been applied to investigate the ferroelectric domain structure of K0.75Na0.25NbO3 epitaxial layers grown on a (110) TbScO3 substrate using metal–organic chemical vapour deposition. Two variants differing in domain wall alignment and vertical lattice parameters have been identified and independently analysed.



Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis
Methods to implement nanostructured models for dynamic simulation of X-ray diffraction in non-periodic layered materials with large d spacing are described, and applied to study the case of bismuth telluride epitaxial films grown on barium difluoride (111) substrates.



Crystal structure of fractionally crystallized waxes isolated from crude oil
A petroleum wax has been extracted from an Indian crude oil and crystallized into two fractions, depending on its solubility in methyl isobutyl ketone–toluene at 298 and 313 K. The crystalline nature of the fractionated waxes has been determined by X-ray diffraction.






Twin domain imaging in topological insulator Bi2Te3 and Bi2Se3 epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction
Imaging with surface- and bulk-sensitive electron and X-ray diffraction based microscopic techniques enabled identification of the twin domain distribution of Bi2Te3 and Bi2Se3 thin films. Correlations between the surface topography and crystal orientation are established.



On the use of two-time correlation functions for X-ray photon correlation spectroscopy data analysis
Two ways to analyse two-time correlation functions and the implications for the evaluation of the correlation times and functional shape of the correlations for equilibrium and non-equilibrium systems are discussed.



Ind_X: program for indexing single-crystal diffraction patterns
A Windows console program, Ind_X, for indexing single-crystal diffraction patterns is presented, and the implemented indexing method is briefly described.



Energy-resolved small-angle neutron scattering from steel
A new analysis technique for energy-resolved small-angle neutron scattering is proposed. The precipitate dimensions in steel determined from fitting the observed neutron attenuation spectra agree with those calculated from conventional fitting of the corresponding small-angle neutron scattering profiles.



Crystallographic and optical study of PbHfO3 crystals
This article details the use of birefringence imaging microscopy and high-resolution X-ray diffraction for determining the symmetries of the phases in PbHfO3 between room temperature and 870 K.



Debye–Waller coefficient of heavily deformed nanocrystalline iron
Extensive deformation of an iron alloy powder increases the static disorder contribution to the thermal factor, with an increase of ∼20% in the Debye–Waller coefficient observed by both X-ray diffraction and extended X-ray absorption fine structure. Molecular dynamics simulations shed light on the underlying mechanisms, confirming the major role played by the grain boundary.



Orientation relationships between α-zirconium and δ-hydride within a hydride blister
Both the expected and an additional orientation relationship between α-Zr and δ-hydride in blistered zirconium alloys are explored through the reconstruction of the parent α-Zr phase from electron backscatter diffraction maps of δ-hydride.



Thermal expansion of deuterated monoclinic natrojarosite; a combined neutron–synchrotron powder diffraction study
A combination of time-of-flight neutron diffraction and synchrotron X-ray powder diffraction has been used to investigate the thermal expansion of a synthetic deuterated natrojarosite from 80 to 440 K under ambient-pressure conditions.