Tue, 21 Jun 2016 08:00:00 EDTAspects of the invention relate to techniques of defect injection for transistor-level fault simulation. A circuit element in a circuit netlist of a circuit is first selected for defect injection. Next, a defect is determined based on whether the selected circuit element is a design-intent circuit element or a parasitic circuit element. After the defect is determined, the defect is injected into the circuit netlist and then the circuit is simulated.
Tue, 31 May 2016 08:00:00 EDTThe disclosed technology is related to adjusting an integrated circuit design while accounting for a local density of the design. In particular exemplary embodiments, a local density value for a layout design that defines a plurality of geometric shapes is derived. Subsequently, one or more of the geometric shapes are adjusted such that the local density value is preserved. With some implementations, the local density value is preserved if the adjusted local density value is within a threshold amount of the derived local density value.
Tue, 03 Nov 2015 08:00:00 ESTRouting methods for an integrated circuit design layout are disclosed. The layout can include design netlists and library cells. A multiple-level global routing can generate topological wire for each net. An area oriented graph-based detail routing on the design can be performed. A post route optimization after the detail routing can be performed to further improve the routing quality. Some methods can be single threaded all or some of the time, and/or multi-threaded some or all of the time.
Tue, 26 May 2015 08:00:00 EDTMethods, systems, and structures for detecting residual material on semiconductor wafers are provided. A method includes scanning a test structure including topographic features on a surface of a semiconductor wafer. The method further includes determining, based on the scanning, that the test structure includes an amount of a residual material of a sacrificial layer that exceeds a predetermined threshold.
Tue, 26 May 2015 08:00:00 EDTDisclosed are methods, systems, and articles of manufactures for implementing physical designs by using multiple force models to iteratively morph a layout decomposition. In addition to attractive force model(s) or repulsive force model(s), the physical implementation also uses a containment force model for grouping multiple design blocks or for confining a node of a cell within the boundary of a container. Another aspect is directed at deriving a first force model at the first hierarchical level from a second force model at the second hierarchical level by directly modifying the second model based at least in part on characteristic(s) of the first hierarchical level and of the second hierarchical level. In a design with multiple hierarchies, a cell-based force model is also used to ensure child nodes of a parent cell stay within a close proximity of the parent node of the parent cell.
Tue, 26 May 2015 08:00:00 EDTA layout-legalizing system modifies a portion of a circuit layout that is selected by a user to generate a modified portion that satisfies a set of technology constraints and a set of design constraints. The system receives as input the set of technology constraints which a semiconductor manufacturing foundry requires the circuit layout to satisfy for manufacturability purposes. The system also receives a set of design constraints from the user which restricts how objects in the portion of the circuit layout can be modified to satisfy the set of technology constraints. The system can further receive a selection input from the user which identifies the portion of the circuit layout which is to be legalized. The system then modifies the identified portion of the circuit layout to obtain a modified portion which satisfies the set of design constraints and at least a subset of the set of technology constraints.
Tue, 26 May 2015 08:00:00 EDTA magnetic tunneling junction device and fabrication method is disclosed. In a particular embodiment, a non-transitory computer-readable medium includes processor executable instructions. The instructions, when executed by a processor, cause the processor to initiate deposition of a capping material on a free layer of a magnetic tunneling junction structure to form a capping layer. The instructions, when executed by the processor, cause the processor to initiate oxidization of a first layer of the capping material to form a first oxidized layer of oxidized material.
Tue, 26 May 2015 08:00:00 EDTMethods and systems are described for placing arithmetic operators on a programmable integrated circuit device (e.g., a PLD). Placement of arithmetic operators of a data flow graph in one of multiple regions (e.g., a region of DSP circuitry blocks or a region of logic fabric circuitry) on the programmable integrated circuitry device may be determined (e.g., randomly). A score related to the performance of the graph (e.g., a score related to data flow graph routing delays or area consumed by the data flow graph) may be determined and this process may be repeated after one of the arithmetic operators of the data flow graph is moved. The placement of arithmetic operators that corresponds to the best value for the score related to the performance of the data flow graph may be stored. Accordingly, more arithmetic operators may be included on a programmable integrated device than in conventional devices.
Tue, 26 May 2015 08:00:00 EDTA datapath extraction tool uses machine-learning models to selectively classify clusters of cells in an integrated circuit design as either datapath logic or non-datapath logic based on cluster features. A support vector machine and a neural network can be used to build compact and run-time efficient models. A cluster is classified as datapath if both the support vector machine and the neural network indicate that it is datapath-like. The cluster features may include automorphism generators for the cell clusters, or physical information based on the cell locations from a previous (e.g., global) placement, such as a ratio of a total cell area for a given cluster to a half-perimeter of a bounding box for the given cluster.
Tue, 26 May 2015 08:00:00 EDTA technique for determining whether an integrated circuit design is susceptible to glitches includes identifying storage elements in an original register-transfer level (RTL) file of the integrated circuit design and identifying clock signals for each of the storage elements in the original RTL file. The technique also includes generating respective assertions for each of the identified clock signals and identifying potential glitchy logic in respective clock paths for each of the identified clock signals. Finally, the technique includes inserting, at the potential glitchy logic, glitches in each of the respective clock paths of the original RTL file to provide a modified RTL file and executing an RTL simulation using the modified RTL file and the respective assertions.
Tue, 26 May 2015 08:00:00 EDTA circuit-design support method includes obtaining information for a circuit having a logic circuit in which signal lines are connected to input terminals, signals of the signal lines being output via the logic circuit; obtaining information concerning a control circuit that has a first flip-flop for scanning and that can control a value of a given signal line by a value set by the first flip-flop; selecting, based on the circuit information, a second flip-flop at an output destination of a signal from the logic circuit, among second flip-flops of the circuit; and generating, based on the control circuit information, information indicating a serial connection of the control circuit between an output source of the signal of the given signal line and the given signal line and a connection of a data input terminal of the first flip-flop and an output terminal of the selected second flip-flop.
Tue, 26 May 2015 08:00:00 EDTIn one embodiment of the invention, an integrated circuit (IC) design tool is provided for synthesizing logic, including one or more software modules to synthesize a gate-level netlist of a squarer functional block. The software modules include a bitvector generator, a bitvector reducer, and a hybrid multibit adder generator. The bitvector generator multiplies bits of a vector together to generate partial products for a plurality of bitvectors and then optimizes a plurality of least significant bitvectors. The bitvector reducer reduces the partial products in the bitvectors of the squarer functional block down to a pair of final vectors. The hybrid multibit adder generator generates a hybrid multibit adder including a first adder and a second adder coupled together by a carry bit with bit widths being responsive to a dividerbit. The hybrid multibit adder adds the pair of final vectors together to generate a final result for the squarer functional block.
Tue, 26 May 2015 08:00:00 EDTA method and system for optical proximity correction (OPC) is disclosed in which a set of shaped beam shots is determined which, when used in a shaped beam charged particle beam writer, will form a pattern on a reticle, where some of the shots overlap, where the pattern on the reticle is an OPC-corrected version of an input pattern, and where the sensitivity of the pattern on the reticle to manufacturing variation is reduced. A method for fracturing or mask data preparation is also disclosed.
Tue, 26 May 2015 08:00:00 EDTAn integrated-circuit memory controller outputs to a memory device a first signal in a first state to enable operation of synchronous data transmission and reception circuits within the memory device. A transaction queue within the memory controller stores memory read and write requests that, to be serviced, require operation of the synchronous data transmission and reception circuits, respectively, within the memory device. Power control circuitry within the memory controller determines that the transaction queue has reached a predetermined state and, in response, outputs the first signal to the memory device in a second state to disable operation of the synchronous data transmission and reception circuits within the memory device.
Tue, 26 May 2015 08:00:00 EDTDescribed herein are methods and systems for providing corrective maintenance using global knowledge sharing. A method to provide corrective maintenance with a CM system includes performing a query to generate a ranking of fixable causes based on factors (e.g., symptoms, configuration, test). The ranking may be determined based on a fixable cause percent match with the factors. The ranking of fixable causes may be associated with one or more solutions for each fixable cause. The ranking can be updated based on performing tests or solutions.
Tue, 26 May 2015 08:00:00 EDTA method of forming a magnetic tunnel junction (MTJ) device includes forming a first MTJ cap layer on a MTJ structure. The first MTJ cap layer includes a first non-nitrified metal. The method also includes forming a second MTJ cap layer over the first MTJ cap layer. The second MTJ cap layer includes a second non-nitrified metal. The method further includes forming a top electrode layer over the second MTJ cap layer. The second MTJ cap layer is conductive and configured to reduce or prevent oxidation.
Tue, 19 May 2015 08:00:00 EDTMethods and systems for managing data loads on a cluster of processors that implement an iterative procedure through parallel processing of data for the procedure are disclosed. One method includes monitoring, for at least one iteration of the procedure, completion times of a plurality of different processing phases that are undergone by each of the processors in a given iteration. The method further includes determining whether a load imbalance factor threshold is exceeded in the given iteration based on the completion times for the given iteration. In addition, the data is repartitioned by reassigning the data to the processors based on predicted dependencies between assigned data units of the data and completion times of a plurality of the processers for at least two of the phases. Further, the parallel processing is implemented on the cluster of processors in accordance with the reassignment.
Tue, 19 May 2015 08:00:00 EDTMethods and apparatuses for circuit design are described. In one embodiment, the method comprises determining a distribution of nets of a circuit, the distribution of the nets comprising numbers of blocks that each of the nets has in each of a plurality of partitions of the circuit in a partitioning solution, moving a first block of the circuit from a source partition to a destination partition to modify the partitioning solution, and updating the distribution of the nets after the moving.
Tue, 19 May 2015 08:00:00 EDTThe disclosure relates generally to triple-redundant sequential state (TRSS) machines formed as integrated circuits on a semiconductor substrate, such as CMOS, and computerized methods and systems of designing the triple-redundant sequential state machines. Of particular focus in this disclosure are sequential state elements (SSEs) used to sample and hold bit states. The sampling and holding of bits states are synchronized by a clock signal thereby allowing for pipelining in the TRSS machines. In particular, the clock signal may oscillate between a first clock state and a second clock state to synchronize the operation of the SSE according to the timing provided by the clock states. The SSEs has a self-correcting mechanism to protect against radiation induced soft errors. The SSE may be provided in a pipeline circuit of a TRSS machine to receive and store a bit state of bit signal generated by combinational circuits within the pipeline circuit.
Tue, 19 May 2015 08:00:00 EDTA method, an apparatus, and a computer program product for wireless communication are provided. The apparatus generates a plurality of interconnect patterns for a set of longitudinal channels that are occupied by horizontal interconnects. Each interconnect pattern may be different from the other interconnect patterns. Each interconnect pattern may define relative locations for the set of horizontal interconnects and gap channels. Highest crosstalk is determined for each of the interconnect patterns and the interconnect pattern with the minimum highest crosstalk is selected as a preferred pattern. The highest crosstalk may comprise far-end crosstalk or near-end crosstalk and may be calculated for a range of frequencies or for a plurality of frequencies. The crosstalk may be calculated by modeling the interconnects as transmission lines.
Tue, 19 May 2015 08:00:00 EDTThe present disclosure relates a method of performing a design rule checking (DRC) procedure on a multi-tiered integrated chip. In some embodiments, the method is performed by defining layer databases for a plurality of tiers within a multi-tiered integrated chip. The layer databases respectively identify design layers within an associated tier. A DRC (design rule checking) deck is then generated, which defines one or more individual design layer definitions as a function of a plurality of layer databases, so that the one or more individual design layer definitions are defined for a plurality of tiers. One or more design rules for the one or more individual design layer definitions are defined within the DRC deck. Since the individual design layer definitions are defined as functions of the plurality of layer databases, the design rules apply to the plurality of tiers.
Tue, 19 May 2015 08:00:00 EDTSome example embodiments include a computer-implemented method for designing an integrated circuit. The computer-implemented method includes receiving a hierarchical network design for the integrated circuit, wherein the hierarchical design comprises a number of components that are coupled together. The computer-implemented method includes detecting that a component of the number of components has at least one of failed timing and incomplete timing based on a problem that comprises at least one of a missing assertion, one or more missing latches, a source driver having an input source slew that is greater than a source slew limit threshold, and a sink having an input sink slew that is greater than a sink slew limit threshold. The computer-implemented method includes replacing the component with a different component that is independent of the problem and testing others components of the number of components based on the different component.
Tue, 19 May 2015 08:00:00 EDTA system, method, and computer program product for containing analog verification IP for circuit simulation. Embodiments introduce analog verification units (“vunits”), and corresponding analog verification files to contain them. Vunits allow circuit design verification requirement specification via text file. No editing of netlist files containing design IP is required to implement static and dynamic circuit checks, PSL assertions, clock statements, or legacy assertions. Vunits reference a top-level circuit or subcircuits (by name or by specific instance), and the simulator automatically binds vunit contents appropriately during circuit hierarchy expansion. Vunits may be re-used for other design cells, and may be easily processed by text-based design tools. Vunits may be provided via vunit_include statements in a control netlist file, command line arguments, or by directly placing a vunit block into a netlist. Vunits may also contain instance statements to monitor or process signals, such as those needed by assertions.
Tue, 19 May 2015 08:00:00 EDTA method for accurately determining the shape of currents in a current spectrum for a circuit design is provided. The method includes determining timing and power consumption characteristics. In one embodiment, timing characteristics are provided through a electronic design automation tool. The timing characteristics yield a current pulse time width. In another embodiment, power consumption characteristics are provided by an EDA tool. The power consumption characteristics yield a current pulse amplitude. The shape of the current pulse is obtained by incrementally processing a power analyzer tool over relatively small time increments over one or more clock cycles while capturing the switching nodes of a simulation of the circuit design for each time increment. In one embodiment, the time increments are one nanosecond or less.
Tue, 19 May 2015 08:00:00 EDTA mechanism for generating gate-level activity data for use in clock gating efficiency analysis of an integrated circuit (IC) design is provided. Generating the gate-level activity data includes generating a signal behaviour description for inter-register signals, generating a gate-level netlist for the IC design, generating gate-level stimuli based at least partly on the generated signal behaviour description, and performing gate-level simulation using the generated gate-level stimuli to generate gate-level activity data for the IC design. In one embodiment, generating the signal behaviour description includes performing Register Transfer Level (RTL) simulation of the IC design, and generating the gate-level netlist includes performing RTL synthesis. The RTL simulation and RTL synthesis are performed on RTL data for the IC design.
Tue, 19 May 2015 08:00:00 EDTMethods for the design of microwave filters comprises comprising preferably the steps of inputting a first set of filter requirements, inputting a selection of circuit element types, inputting a selection of lossless circuit response variables, calculating normalized circuit element values based on the input parameters, and generate a first circuit, insert parasitic effects to the normalized circuit element values of the first circuit, and output at least the first circuit including the post-parasitic effect circuit values. Additional optional steps include: requirements to a normalized design space, performing an equivalent circuit transformation, unmapping the circuit to a real design space, performing a survey, and element removal optimization. Computer implement software, systems, and microwave filters designed in accordance with the method are included.
Tue, 19 May 2015 08:00:00 EDTA method of creating a datasheet includes obtaining integrated circuit data from at least one data source, creating a data structure including the integrated circuit data obtained from the at least one data source, and creating a datasheet using data contained in the data structure. The datasheet is created in a human-readable format.
Tue, 19 May 2015 08:00:00 EDTA method for mask data preparation or mask process correction is disclosed in which a set of charged particle beam shots is determined which is capable of forming a pattern on a surface, wherein critical dimension uniformity (CDU) of the pattern is optimized. In some embodiments the CDU is optimized by varying at least two factors. In other embodiments, model-based techniques are used. In yet other embodiments, the surface is a reticle to be used in an optical lithographic process to form a pattern on a wafer, and CDU on the wafer is optimized.
Tue, 19 May 2015 08:00:00 EDTA method and apparatus for partitioning of the input design into repeating patterns called template cores for the application of reticle enhancement methods, design verification for manufacturability and design corrections for optical and process effects is accomplished by hierarchy analysis to extract cell overlap information. Also hierarchy analysis is performed to extract hierarchy statistics. Finally template core candidates are identified. This allows to the design to be made amenable for design corrections or other analyses or modifications that are able to leverage the hierarchy of the design since the cell hierarchy could otherwise be very deep or cells could have significant overlap with each other.
Tue, 19 May 2015 08:00:00 EDTThe systems and methods of the present disclosure calibrate impedance loss model parameters associated with an electrosurgical system having no external cabling or having external cabling with a fixed or known reactance, and obtain accurate electrical measurements of a tissue site by compensating for impedance losses associated with the transmission line of an electrosurgical device using the calibrated impedance loss model parameters. A computer system stores voltage and current sensor data for a range of different test loads and calculates sensed impedance values for each test load. The computer system then predicts a phase value for each load using each respective load impedance value. The computer system back calculates impedance loss model parameters including a source impedance parameter and a leakage impedance parameter based upon the voltage and current sensor data, the predicted phase values, and the impedance values of the test loads.
Tue, 19 May 2015 08:00:00 EDTIn a method for simulating temperature and electrical characteristics within an circuit, a temperature of at least one volume within the circuit as a function of a resistance within the at least one volume is repeatedly calculated and the resistance as a function of the temperature is repeatedly calculated until the temperature is within a predetermined tolerance of a previous temperature result and until the resistance is within a predetermined tolerance of a previous resistance result. Once the temperature is within a predetermined tolerance of the previous temperature result and the resistance is within a predetermined tolerance of the previous resistance, then an output indicative of the temperature is generated.
Tue, 19 May 2015 08:00:00 EDTA via disposition information acquiring unit acquires via disposition information indicating a disposition of the plurality of first vias (212). A second conductor information acquiring unit acquires second conductor information indicating disposition positions of a plurality of second conductors (232) repeatedly disposed in the second conductor layer (230). A via extracting unit extracts an extraction via with respect to each of the plurality of second conductors (232). The extraction via is each of the first vias (212) overlapping the second conductor (232). A via selecting unit selects a selection via with respect to each of the plurality of second conductors (232). The selection via is each of first vias (212) selected in a predetermined number from the extraction vias. An opening introducing unit introduces a first opening (234) to each of the plurality of second conductors (232). The first opening (234) overlaps the extraction via not selected by the via selecting unit in plan view.
Tue, 19 May 2015 08:00:00 EDTIn a method for fracturing or mask data preparation or mask process correction for charged particle beam lithography, a plurality of shots are determined that will form a pattern on a surface, where shots are determined so as to reduce sensitivity of the resulting pattern to changes in beam blur (βf). In some embodiments, the sensitivity to changes in βf is reduced by varying the charged particle surface dosage for a portion of the pattern. Methods for forming patterns on a surface, and for manufacturing an integrated circuit are also disclosed, in which pattern sensitivity to changes in βf is reduced.
Tue, 12 May 2015 08:00:00 EDTAn integrated circuit includes core logic and a plurality of interface blocks disposed about a periphery of the core logic. A plurality of input or output (I/O) circuits is assigned to one of the plurality of interface blocks. The I/O circuits include external I/O circuits coupled to a device other than the integrated circuit and internal I/O circuits coupled to the integrated circuit. Each interface block includes a first plurality of I/O circuits disposed on a first side of the interface block and a second plurality of I/O circuits disposed on a second side of the interface block. Each interface block also includes interface logic for the interface block between the first plurality of I/O circuits and the second plurality of I/O circuits, and a logic hub that includes a clock distribution of minimal length that drives launch logic and capture logic to form the I/O circuits of the interface block.
Tue, 12 May 2015 08:00:00 EDTAspects of the invention relate to techniques of generating guiding patterns for via-type feature groups. A guiding pattern may be constructed for a via-type feature group that comprises two or more via-type features in a layout design. A backbone structure may then be determined for the guiding pattern. Based on the backbone structure and a self-assembly model, simulated locations of the two or more via-type features are computed. The simulated locations are compared with targeted locations. If the simulated locations do not match the targeted locations based on a predetermined criterion, the simulated locations adjusted to derive modified locations. Using the modified locations, the above operations may be repeated until the simulated locations match the targeted location based on a predetermined criterion or for a predetermined number of times.
Tue, 12 May 2015 08:00:00 EDTAn integrated circuit having a programmable clock spreader configured to generate a plurality of controllably skewed clock signals, each applied to a corresponding region within the integrated circuit with circuitry configured to be triggered off the applied clock signal. The programmable clock spreader is designed to enable customization of the current-demand characteristics exhibited by the integrated circuit, e.g., based on the circuit's spectral impedance profile, to cause transient voltage droops in the power-supply network of the integrated circuit to be sufficiently small to ensure proper and reliable operation of the integrated circuit.
Tue, 12 May 2015 08:00:00 EDTA method for designing a transformer in an integrated circuit includes receiving one or more desired characteristics of the transformer from user input and iteratively determining a design solution for the transformer through one or more simulations and modifications using a rule-set. The method combines the one or more desired characteristics with other preset characteristics of the transformer or the integrated circuit. A first model of the transformer is defined with typical load impedances and simulated having the combined characteristics to determine performance. Results of the simulation are processed to calculate performance with the load impedances specified by the user. The results are further processed to obtain a mathematical model that includes tuning capacitors. The first and subsequent models are modified by drawing on a rule-set of expert knowledge relating to general dependency of at least one design criterion, such as a physical, geometrical or performance characteristic, with another design criterion.
Tue, 12 May 2015 08:00:00 EDTA leakage power control vector is loaded into existing test scan chain elements for application to circuit elements of a circuit in which the leakage currents are to be controlled. The vector is designed to configure the circuit elements into states in which leakage currents are reduced. A multiplexer selects the power control vector for loading into the scan chain elements, and a clock generator clocks the configuration vector into the scan chain elements. A sleep mode detector may be provided to configure the multiplexer to select the power control vector and to operate the clock generator to clock the power control vector into the scan chain elements when a sleep mode of the circuit is detected.
Tue, 12 May 2015 08:00:00 EDTA method includes providing a design of a semiconductor device such as a stacked CMOS device comprising a plurality of circuit elements to be assigned into a layout of a plurality of tiers, and identifying at least one first type of circuit element within the plurality of circuit elements based on at least one predetermined criterion. Each respective one of the at least one first type of circuit element is to be assigned to a respective designated one of the plurality of tiers. The method further includes dividing the remainder of the plurality of circuit elements into at least two groups of circuit elements based on circuit density, and assigning the at least one first type of circuit element and the at least two groups of circuit elements to respectively different ones of the plurality of tiers of the semiconductor device.
Tue, 12 May 2015 08:00:00 EDTA method of asymmetric asynchronous decoupling of capacitors in an integrated circuit design is provided for faster simulation by circuit simulators, e.g. FastSPICE circuit simulators. This method includes removing a coupling capacitor from a list, which includes coupling capacitors that capacitively couple two nets in the design. The two nets have capacitances C1 and C2, and at least one of capacitances C1 and C2 exceeds a threshold. The coupling capacitor has capacitance Cc. When coupling capacitance Cc is low and only one of capacitances C1 and C2 has a low capacitance, then a forward capacitance can be used at whichever of the two nets has the low capacitance and a lump capacitance can be used at the other net for simulation. When coupling capacitance Cc is low and both of capacitances C1 and C2 have high capacitances, then lump capacitances can be used at the two nets for the simulation.
Tue, 12 May 2015 08:00:00 EDTA relationship between distance from a back bias control section which outputs a control signal for controlling a back bias of a transistor and an amount of noise in the control signal outputted from the back bias control section is found. An increase of jitter corresponding to the amount of the noise in a clock transmitted on a clock path connected to a circuit section (IP macro) is found on the basis of the relationship between the distance from the back bias control section and the amount of the noise. The circuit section and the clock path are placed on the basis of the increase of the jitter and an allowable jitter value for the circuit section.
Tue, 12 May 2015 08:00:00 EDTA method for bypassing a defective through silicon via x in a group of n adjacent through silicon vias, includes receiving a plurality of relief signals to identify the defective through silicon via x, activating x−1 switch circuits to connect x−1 data circuits to through silicon vias 1 to x−1 in the group of n adjacent through silicon vias, activating n-x switch circuits to connect n-x data circuits to through silicon vias x+1 to n in the group of n adjacent through silicon vias, and activating a switch circuit to connect a data circuit to an auxiliary through silicon via which is adjacent through silicon via n in the group of n adjacent through silicon vias.
Tue, 12 May 2015 08:00:00 EDTOne implementation of the disclosure provides a crosstalk analysis method executed by a computer. The method includes steps of: executing a layout program; executing a crosstalk analysis program; acquiring, by the crosstalk analysis program, a plurality of parameters from a layout result generated by the layout program; estimating a crosstalk value according to the parameters; determining whether the crosstalk value is larger than a predetermined value; providing a layout suggestion table when the crosstalk value is larger than the predetermined value.
Tue, 12 May 2015 08:00:00 EDTThis disclosure relates generally to systems and methods for simulating physical active semiconductor components using in silico active semiconductor components. To simulate charge degradation effect(s) in a circuit simulation, a simulated defect signal level is produced. More specifically, the simulated defect signal level simulates at least one charge degradation effect in the in silico active semiconductor component as a function of simulation time and a simulated input signal level of a simulated input signal. As such, the charge degradation effect(s) are simulated externally with respect to the in silico active semiconductor component. In this manner, the in silico active semiconductor component does not need to be reprogrammed in order to simulate charge degradation effects.
Tue, 12 May 2015 08:00:00 EDTA system, method, and computer program product for automatically generating equivalent assertions in different forms for different verification tools, which may be analog or digital. A user submits a set of logic assertions that, if unclocked, are converted to clocked assertions by generating and skewing clocks to ensure simulator uniformity. A stimulus is generated, perhaps at random, or input. A test bench is either input or synthesized. For each verification tool, the test bench is simulated and simulation results are captured. An assertion status difference engine evaluates result differences between the verification tools, and identifies and outputs differences indicating a significant inconsistency. Errors in verification tool implementation and user assertion coding can be detected. The simulators used may include SPICE and Verilog, or any other simulators that differ in type, simulation algorithm, input format, or vendor implementation.
Tue, 12 May 2015 08:00:00 EDTMethods are provided to facilitate automated creation and management of design rule checking or DRC waiver descriptions. Embodiments include receiving a plurality of first checksums corresponding to respective first geometric element violations waived in association with a block of an integrated circuit design, the first checksums being based on a first version of at least one design verification rule and/or of the block, receiving a second checksum corresponding to a second geometric element violation associated with the block, the second checksum being based on a second version of the design verification rule and/or of the block, determining whether the second checksum corresponds to at least one of the first checksums, and, if the second checksum does not correspond to at least one first checksum, generating a waiver request for the second geometric element error.
Tue, 12 May 2015 08:00:00 EDTA method, a system and a computer readable medium for providing information relating to a verification of a digital circuit. The verification may be formal verification and comprise formally verifying that a plurality of formal properties is valid for a representation of the digital circuit. The method comprises replacing at least a first input value relating to the representation of the digital circuit by a first free variable, determining if at least one of the plurality of formal properties is valid or invalid after replacing the first input value by the first variable and indicating if the at least one of the plurality of formal property is valid or invalid. The use of a free or open variable that has not determined value can be directly in the description or representation of the digital circuit. It is not necessary to insert errors or to apply an error model.
Tue, 12 May 2015 08:00:00 EDTA plurality of Field Programmable Gate Arrays (FPGA), high performance transceivers, and memory devices provide a verification module for timing and state debugging of electronic circuit designs. Signal value compression circuits and gigabit transceivers embedded in each FPGA increase the fanout of each FPGA. Ethernet communication ports enable remote software debugging of processor instructions.
Tue, 12 May 2015 08:00:00 EDTThis disclosure relates generally to field-programmable gate arrays (FPGAs). Some implementations relate to methods and systems for transmitting and integrating an intellectual property (IP) block with another user's design. The IP developer can design the IP block to include both a secret portion and a public portion. The IP block developer can send or otherwise provide the IP block to another IP user without disclosing the functional description of the secret portion of the IP block. In some implementations, the IP developer provides the public portion to the IP user at the register-transfer-level (RTL) level, as a hardware description language (HDL)-implemented design, or as a synthesizable netlist. In some implementations, the IP developer provides the secret portion of the IP block to the user in the form of programming bits without providing an HDL, RTL, or netlist implementation of the secret portion.
Tue, 12 May 2015 08:00:00 EDTA method of patterning a plurality of layers of a work piece in a series of writing cycles in one or a plurality of write machines, the workpiece being deviced to have a number of N layers and layers of the workpiece having one or a plurality of boundary condition(s) for pattern position, the method comprising the steps of: determining the boundary conditions of layers 1 to N, calculating deviations due to the boundary conditions and calculating a compensation for the deviation of the first transformation added with the assigned part of the deviation due to the boundary conditions.